Methods of Structure Analysis II (FSI-WA2)

Academic year 2018/2019
Supervisor: Ing. Ondřej Man, Ph.D.  
Supervising institute: ÚMVI all courses guaranted by this institute
Teaching language: Czech
Aims of the course unit:
The course objective is to make students familiar with the basic methods of structural and phase analyses, and broadens this knowledge to cover methods used in fundamental research as well as methods used in metallurgical analyses and engineering (spectroscopic methods). The objective is to prepare future materials specialists for a quick analysis of an optimum choice of the solving method of a given operation problem or solving problems of both fundamental and applied research.
Learning outcomes and competences:
Students will have a general overview in selected areas and a more in-depth knowledge of the methods of studying structure, substructures, phase and chemical composition of materials.
Prerequisites:
The study in this course requires the knowledge of basic experimental methods that are used in the study of the structure of engineering materials (in particular light and electron microscopy, and methods of local chemical analysis in electron microscopes). To understand the content of this course, the knowledge of mathematics, physics and materials sciences is inevitable, at least on the level of a of the Bachelor´s degree of mechanical engineering study.
Course contents:
The coarse is concerned with:special microscopic and diffraction methods,i.e.confocal microscopy, ion microscopy,dual beam microscopy,low voltage TEM,EXAFS, low electron diffraction,low energy electron SEM,X-Ray microscopy,etc.Methods of surface analysis.Principles of other selected physical methods.
Teaching methods and criteria:
The course is taught through lectures explaining the basic principles and theory of the discipline. Teaching is suplemented by practical laboratory work.
Assesment methods and criteria linked to learning outcomes:
The exam has a written and an oral part. Awarding the course-unit credit is conditional on submitting written reports on assigned topics.
Controlled participation in lessons:
Compulsory attendance at laboratory exercises and instruction visits. Absence from exercises is dealt with individually, usually by way of make-up assignment.
Type of course unit:
    Lecture  13 × 2 hrs. optionally                  
    Labs and studios  13 × 2 hrs. compulsory                  
Course curriculum:
    Lecture 1.High resolution electron microscopy
2.Electron microscopy of nanoobjects in SEM (and TEM)-problems and solutions ,
3.Special methods of electron microscopy (low energy electron SEM,low voltage TEM,etc.)
4.Ion beam microscopy,dual beam microscopy,their using for sample preparation and tomography
5.Lorentz microscopy,
6.Principles and applications of selected methods I (acustic emission,laser)
7.Principles and applications of selected methods II (X-Ray microscopy and topography,etc.)
8.and9.Methods of surface analysis (AES,SIMS,SIPS,XPS)
10.Confocal microscopy, holographic microscopy
11.Mössbauer spectroscopy
12,13 Principles and applications of other selected experimental methods (SAXS,NMR,neutron and proton diffraction,elipsometry,ECP,FIM,etc.)
    Labs and studios 1.Examples of HR TEM and HR STEM applications
2.HR TEM laboratory-demonstration and using
3.Examples of HR SEM applications
4.FIB/SEM laboratory-demonstration of application and possibilities
5.Laboratory of electron litography
6.Laboratory of LIBS
7.Laboratory of Delong Instruments (demo of X-RAY and Mini-TEM)
8.Laboratory of Auger spectroscopy
9.XPS and SIMS laboratory
10.Laboratory of confocal microscopy and holography
11.Laboratory of IPM and TESCAN
12.Experimental possibilities o selected methods
13.Summary, questions, disscusion
Literature - fundamental:
1. FLEWITT, P. E. J a Robert K WILD. Physical methods for materials characterisation. Bristol: Institute of Physics Publishing, 1994, xvi, 517 p. : il. ISBN 0-7503-0320-4.ProQuest Ebook Central
2. BRANDON, David a Wayne D KAPLAN. Microstructural characterization of materials. New York: John Wiley, 1999, 409 s. : il. ISBN 0-471-98501-5.
3. KLOUDA, Pavel. Moderní analytické metody. Třetí, upravené vydání. Ostrava: Pavel Klouda - nakladatelství Pavko, 2016, 176 stran : ilustrace ; 24 cm. ISBN 978-80-86369-22-8.
4. FRANK, Luděk a Jaroslav KRÁL. Metody analýzy povrchů: iontové, sondové a speciální metody. Praha: Academia, 2002, 489 s. ISBN 80-200-0594-3.
Literature - recommended:
1. BRIGGS, D. (David) a John T. GRANT. Surface analysis by auger and X-ray photoelectron spectroscopy. Chichester: Manchester: IM Publications ; SurfaceSpectra, 2003, xi, 899 stran : ilustrace, tabulky, grafy. ISBN 1-901019-04-7.
2. KAUPP, Gerd. Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces. Berlin: Springer, 2006, vii, 292 s. : il. ISBN 3-540-28405-2.
3. LAJUNEN, Lauri H.J. Spectrochemical Analysis by Atomic Absorption and Emission. Cambridge: The Royal Society of Chemistry, 1992, 241 s. ISBN 0-85186-873-8.
The study programmes with the given course:
Programme Study form Branch Spec. Final classification   Course-unit credits     Obligation     Level     Year     Semester  
M2A-P full-time study M-MTI Materials Engineering -- GCr 5 Compulsory 2 2 W