Methods and Equipment for Technical Diagnostic (FSI-XTD-K)

Academic year 2018/2019
Supervisor: doc. Ing. Stanislav Průša, Ph.D.  
Supervising institute: ÚFI all courses guaranted by this institute
Teaching language: Czech
Aims of the course unit:
The course focuses on the physical principles of the selected measurement systems.
Learning outcomes and competences:
Students will acquire skills and experience with respect to measurement methods, application of sensors, and configurations and functional descriptions of measuring instruments.
Prerequisites:
Successful completion of the course is conditional on the knowledge and skills acquired in the courses "Physics I", "Physics II", "Metrological Physics".
Course contents:
The course introduces students to the theory of advanced measurement techniques and measuring systems with nanometer resolution.
Teaching methods and criteria:
The course is taught through lectures supported by several laboratory experiments.
Assesment methods and criteria linked to learning outcomes:
An examination composed from oral and written part. Active participation at laboratory experiments and making valuable reports.
Controlled participation in lessons:
Attendance at seminars in labs is required.
Type of course unit:
    Guided consultation  1 × 4 hrs. optionally                  
    Laboratory exercise  1 × 9 hrs. compulsory                  
    Controlled Self-study  1 × 26 hrs. optionally                  
Course curriculum:
    Guided consultation General definitions and theory. Statistics and data processing: classification of random parameters (Gaussian and uniform distribution). Law of error propagation. Experimental data processing.

Sensors: general classification, capacity sensors, sensors based on induction.

Advanced methods of visualisation and diagnostics: Michalson interferometry, X-ray diffraction, scanning electron microscopy, atomic force microscopy, scanning tunnelling microscopy.
    Laboratory exercise Laboratory works:
Polarization
Diffraction
Photometry
Wire optics
LCD display

Practical demonstrations:
CT - Computer tomography for industry
LIBS – ablation using pulsed LASER beams
SEM – Scanning Electron Microscopy
AFM - Atomic Force Microscopy
STM – Scanning Tunneling Microscopy
    Controlled Self-study General definitions and theory. Statistics and data processing: classification of random parameters (Gaussian and uniform distribution). Law of error propagation. Experimental data processing.

Sensors: general classification, capacity sensors, sensors based on induction.

Advanced methods of visualisation and diagnostics: Michalson interferometry, X-ray diffraction, scanning electron microscopy, atomic force microscopy, scanning tunnelling microscopy.
Literature - fundamental:
1. DOEBELIN, O.D. Measurement Systems. Application and Design. 4. vydání. New York: McGraw-Hill, 1990. 960 s. ISMN 0-07-100697-4.
2. ANTHONY, D.M. Engineering Metrology. New York: Pergamon Press, 1987.
3. SERWAY, R.A. and BEICHNER, R.J. Physics for Scientist and Engineers with Modern Physics. 5. vydání. Orlando: Saunders College Publisching, 2000. 1551 s.
4. ORNATSKIJ, P.P. Teoretičeskije osnovy informacionno-izměritělnoj techniki. Kijev: Vyšča škola, 1976. 431 s.
Literature - recommended:
1. HALLIDAY, D., RESNICK, R. and WALKER, J. Fyzika. 1198 s. Brno-Praha:VUTIUM-PROMETHEUS, 2000. Přeloženo z: Fundamentals of Physics, 5.vydání: Wiley,1997 (s přihlédnutím ke změnám pro 6. vydání pro rok 2001).
2. DOEBELIN, O.D. Measurement Systems. Application and Design. 4. vydání. New York: McGraw-Hill, 1990. 960 s. ISMN 0-07-100697-4.
3. Električeskije izměrenija nelekričeskich veličin. P.V. Novickij, ed. Leningrad: Energie, 1075. 575 s.
4. JENČÍK, J., KUHN, L. a další. Technická měření ve strojírenství. Praha: SNTL, 1982. 580 s.
The study programmes with the given course:
Programme Study form Branch Spec. Final classification   Course-unit credits     Obligation     Level     Year     Semester  
M2I-K combined study M-KSB Quality, Reliability and Safety -- GCr 4 Compulsory 2 2 S