Advanced Methods of Electron Microscopy (FSI-9MEM)

Academic year 2021/2022
Supervisor: prof. RNDr. Antonín Dlouhý, CSc.  
Supervising institute: ÚMVI all courses guaranted by this institute
Teaching language: Czech
Aims of the course unit:
Theoretical background mastering and generation of experimentla skills from direct works and analytical methods applied with advanced electron microscopes.
Learning outcomes and competences:
Practical skills with advanced methods of materials analyses by using transmission microscope techniques.
Prerequisites:
Materials analysis methods - basic course
Course contents:
The interaction of electrons with solids are briefly reviewed with the emphasis given to elastically and inelastically scattered electrons and the origin of characteristic X-rays, which are used for chemical analysis in electron microscopy. The physical origin of image diffraction and phase contrasts in the transmission electron microscope are discussed. Special attention is paid to the formation of Kikuchi line diffraction patterns. In scanning electron microscopy, Kikuchi lines are used for all orientation imaging techniques (OIM /EBSD) which allow us to determine the orientation of grains and to establish the presence of textures. In the case of transmission electron microscopy, Kikuchi line diffraction patterns are used as crystallographic maps which allow to orient single crystals. It will be explained how simple two beam diffraction contrasts can be obtained and a brief introduction into stereographic 3D methods in scanning and transmission electron microscopy will be given. The students will practice all the theoretical concepts themselves by performing exercises at a modern electron microscope.
Teaching methods and criteria:
Summer school of electron microscopy - seminar combined with practical exercises
Assesment methods and criteria linked to learning outcomes:
Pass out the Summer school, test of practical microscope operation.
Practical skills of the microscope operation and interpretation of EM images
Controlled participation in lessons:
Lectures and practical excercises at transmission microscopes. Summer school of electron microscopy - seminar combined with practical exercises
Type of course unit:
    Lecture  10 × 2 hrs. optionally                  
Course curriculum:
    Lecture 1. The interaction of electrons with solids with the emphasis given to elastically and inelastically scattered electrons and the origin of characteristic X-rays.
2. The physical origin of image diffraction and phase contrasts in the transmission electron microscope.
3. Kikuchi line diffraction patterns formation. Kikuchi lines are used for all orientation imaging techniques (OIM /EBSD) in SEM which allow to determine the orientation of grains and to establish the presence of textures. In the case of TEM, Kikuchi line diffraction patterns are used as crystallographic maps which allow to orient single crystals.
4. Simple two beam diffraction contrasts obtaining
5. Brief introduction into stereographic 3D methods in scanning and transmission electron microscopy will be given.
The students will practice all the theoretical concepts themselves by performing exercises at a modern electron microscope.
Literature - fundamental:
1. Hirsch, P., Howie, A., Nicholson, R.B., Pashley, D.W. and Whelan, M.J. Electron Microscopy of Thin Crystals. Krieger, New York, 1977.
Literature - recommended:
1. David B. Williams, C. Barry Carter: Transmission Electron Microscopy: A Textbook for Materials Science (4 Vol set) 2nd Edition, Plenum Press, New York, 1996, ISBN-13: 978-0387765020.
The study programmes with the given course:
Programme Study form Branch Spec. Final classification   Course-unit credits     Obligation     Level     Year     Semester  
D-MAT-P full-time study --- no specialisation -- DrEx 0 Recommended course 3 1 W
CEITEC-AMN-EN-P full-time study --- no specialisation -- DrEx 0 Recommended course 3 1 W
CEITEC-AMN-EN-K combined study --- no specialisation -- DrEx 0 Recommended course 3 1 W
CEITEC-AMN-CZ-K combined study --- no specialisation -- DrEx 0 Recommended course 3 1 W
CEITEC-AMN-EN-Z visiting student --- no specialisation -- DrEx 0 Recommended course 3 1 W
D-MAT-K combined study --- no specialisation -- DrEx 0 Recommended course 3 1 W
CEITEC-AMN-CZ-P full-time study --- no specialisation -- DrEx 0 Recommended course 3 1 W