Selected Topics in Electron Microscopy (FSI-TM0)

Academic year 2023/2024
Supervisor: Ing. Tomáš Vystavěl  
Supervising institute: ÚFI all courses guaranted by this institute
Teaching language: Czech
Aims of the course unit:
After succesfull passing the course, the students should be able to:
- describe the construction of various types electron microscopes
- characterise individual physical phenomena yielding the image and discuss the function of the aparatus blocks
- evaluate the utility of different types EM for particular sample measurement.
Learning outcomes and competences:
Knowledge of the principles of construction of electron microscope and functionality of its parts.
Prerequisites:
Knowledge of electromagnetism on the level defined by the textbook HALLIDAY, D. - RESNICK, R. - WALKER, J.: Fundamentals of Physics. J. Wiley and Sons.
Course contents:
The course deals with problems of electron microscopy and related methods. Accented are physical principles, construction and production of electron microscopes.
Teaching methods and criteria:
lectures + hands on lesson
Assesment methods and criteria linked to learning outcomes:
credits, based on final discussion
Controlled participation in lessons:
Participation at lectures
Type of course unit:
    Lecture  13 × 2 hrs. optionally                  
Course curriculum:
    Lecture 1. Basics of scanning and transmission electron microscopy
2. Applications of electron microscopy
3. Electron and ion optics
4. Sources of electrons and ions
5. Interaction of electrons and ions with solid state matter
6. Ssignal detection im electron microscopy
7. Vacuum system
8. Sample manipulation inside electron microscope
9. Sample stages
10. Electron microscope as a system
11. Contrast of image 1. (SEM)
12. Contrast of image 2. (TEM)
13. Electron microscope as an analytical lab
14. Mopdern trends in electron microscopy
15. Practical demonstration
Literature - fundamental:
1. GOLDSTEIN, Joseph I. Scanning electron microscopy and X-ray microanalysis. 3rd ed. New York: Kluwer Academic/Plenum publishers, 2003. xix, 689 s. ISBN 0-306-47292-9
2. REIMER, Ludwig. Transmission Electron Microscopy :Physics of Image Formation and Microanalysis. 3. ed. Berlin, 1993. 545 s. ISBN 3-540-56849-2
3. REIMER, Ludwig. Scanning electron microscopy :physics of image formation and microanalysis. Berlin, 1985. 457 s. ISBN 3-540-13530-8
The study programmes with the given course:
Programme Study form Branch Spec. Final classification   Course-unit credits     Obligation     Level     Year     Semester  
N-PMO-P full-time study --- no specialisation -- Cr 2 Elective 2 2 S
N-FIN-P full-time study --- no specialisation -- Cr 2 Elective 2 1 S
N-FIN-P full-time study --- no specialisation -- Cr 2 Elective 2 2 S