Academic year 2023/2024 |
Supervisor: | doc. Ing. Stanislav Průša, Ph.D. | |||
Supervising institute: | ÚFI | |||
Teaching language: | Czech or English | |||
Aims of the course unit: | ||||
Describe physical principles of selected measuring methods and measuring equipments. | ||||
Learning outcomes and competences: | ||||
Understanding of selected physical principles and their application in measurements, sensors and equipments. | ||||
Prerequisites: | ||||
Successful completion of the course is conditional on the knowledge and skills acquired in the courses "Physics I", "Physics II", "Metrological Physics". | ||||
Course contents: | ||||
The course introduces students to the theory of advanced measurement techniques and measuring systems with nanometer resolution. | ||||
Teaching methods and criteria: | ||||
The course is taught through lectures explaining the basic principles and theory of the discipline. | ||||
Assesment methods and criteria linked to learning outcomes: | ||||
An examination composed from oral and written part. | ||||
Controlled participation in lessons: | ||||
Participation at every course parts. | ||||
Type of course unit: | ||||
Lecture | 10 × 2 hrs. | optionally | ||
Course curriculum: | ||||
Lecture | General definitions and theory. Statistics and data processing: classification of random parameters (Gaussian and uniform distribution). Law of error propagation. Experimental data processing. Sensors: general classification, capacity sensors, sensors based on induction. Advanced methods of visualisation and diagnostics: scanning electron microscopy, atomic force microscopy, scanning tunnelling microscopy. |
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Literature - fundamental: | ||||
1. DOEBELIN, O.D.: Measurement Systems. Application and Design.. New York: McGraw-Hill, 1990. | ||||
2. ORNATSKIJ, P.P.: Teoretičeskije osnovy informacionno-izměritělnoj techniki. Kijev: Vyšča škola, 1976. | ||||
3. Normy: Mezinárodní slovník základních a všeobecných termínů v metrologii.. ČSN 01 0115 | ||||
4. BOX, G.E.P., HUNTER, W.G., HUNTER, J.S. Statistics for Experiments-an Introduction to Design, Data Analysis and Model Building, Wiley 1978 | ||||
5. RIPKA, P.; TIPEK, A. Master Book of Sensors, part A, part B, Czech Technical University, 2003 | ||||
6. WIESENDAGER. R., GUNTHERODT. J.H.: Scanning Tuneling Microscopy II, Springer 1995 | ||||
7. REIMER, L, Scanning Electron Microscopy (2nd ed.), Springer,1998 | ||||
8. WILIAMS, D. B., CARTER, C. B. Transmission Electron Microscopy (2nd ed.), Springer, 2009 | ||||
Literature - recommended: | ||||
1. DOEBELIN, O.D.: Measurement Systems. Application and Design.. New York: McGraw-Hill, 1990. | ||||
2. Normy: Vyjadřování nejistoty při měření. | ||||
3. JENČÍK, J., KUHN, L. a další: Technická měření ve strojírenství.. Praha: SNTL, 1982. |
The study programmes with the given course: | |||||||||
Programme | Study form | Branch | Spec. | Final classification | Course-unit credits | Obligation | Level | Year | Semester |
D-APM-P | full-time study | --- | -- | DrEx | 0 | Recommended course | 3 | 1 | W |
D-APM-K | combined study | --- | -- | DrEx | 0 | Recommended course | 3 | 1 | W |
Faculty of Mechanical Engineering
Brno University of Technology
Technická 2896/2
616 69 Brno
Czech Republic
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