Methods of Structure Analysis II (FSI-WA2)

Academic year 2020/2021
Supervisor: Ing. Ondřej Man, Ph.D.  
Supervising institute: ÚMVI all courses guaranted by this institute
Teaching language: Czech
Aims of the course unit:
To provide an overview (together with the subject Methods of structure analysis) of analytical techniques that a material specialist can make use of both in practice and research.
Learning outcomes and competences:
The overwiev on microscopy and analytical techniques for industrial practise shall be extended by knowledge of advanced techniques for research and complex issue assessment.
Prerequisites:
The study in this course requires the knowledge of basic experimental methods that are used in the study of the structure of engineering materials (in particular light and electron microscopy, and methods of local chemical analysis in electron microscopes). To understand the content of this course, the knowledge of mathematics, physics and materials sciences is inevitable, at least on the level of the Bachelor´s degree of mechanical engineering study.
Course contents:
The subject is a continuation of Methods of structure analysis and covers the following topics:
Spectroscopic methods for macroscopic chemical composition assessment of solid matter, electron- and probe-microscopy techniques for surface analysis, spectroscopic techniques for thin layer and surface analyses, selected methods of organic matter analysis, tomography and 3D analytical techniques, methods of study of magnetic properties of materials.
Teaching methods and criteria:
The course is taught through lectures explaining the basic principles and theory of the discipline. Teaching is suplemented by practical demonstrations and excursions.
Assesment methods and criteria linked to learning outcomes:
The conditon for awarding the course-unit credit is to defend the semestral project.
Controlled participation in lessons:
Compulsory attendance at practical lessons and excursions. Absence from exercises is dealt with individually.
Type of course unit:
    Lecture  13 × 2 hrs. optionally                  
    Laboratory exercise  13 × 2 hrs. compulsory                  
Course curriculum:
    Lecture Following nominal order of topics is subject to changes according to opportunities in organizing the practical lessons:
- macroscopic analytical techniques (introduction)
- optical emission spectroscopy (OES)
- atomic absorption spectroscopy (AAS)
- combustion analysers C, N, O, H
- microscopy and spectroscopy of Auger electrons
- secondary ion mass spectroscopy (SIMS)
- X-ray photoelectron spectroscopy (XPS)
- Raman and infrared spectroscopy (FTIR)
- scanning probe microscopy (STM, AFM, SNOM)
- combined micro- and spectroscopic methods (TERS, SERS)
- advanced X-ray diffraction and scattering techniques (SAXS, GISAXS, X-ray topography, synchrotrons)
- neutron diffraction
- Mössbauer spectroscopy
- measurement of magnetic properties of materials
- X-ray tomography, micro- and nano-tomography
- destructive tomography techniques (3D FIB)
    Laboratory exercise Following nominal order of topics is subject to changes according to opportunities in organizing the practical lessons:
- optical emission spectroscopy (OES), atomic absorption spectroscopy (AAS), combustion analysers C, N, O, H
- microscopy and spectroscopy of Auger electrons, secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS)
- Raman and infrared spectroscopy (FTIR), scanning probe microscopy (STM, AFM, SNOM)
- advanced X-ray diffraction and scattering techniques
- Mössbauer spectroscopy, measurement of magnetic properties of materials
- X-ray tomography, micro- and nano-tomography, destructive tomography techniques (3D FIB)
Literature - fundamental:
1. FLEWITT, P. E. J a Robert K WILD. Physical methods for materials characterisation. Bristol: Institute of Physics Publishing, 1994, xvi, 517 p. : il. ISBN 0-7503-0320-4.ProQuest Ebook Central
2. BRANDON, David a Wayne D KAPLAN. Microstructural characterization of materials. New York: John Wiley, 1999, 409 s. : il. ISBN 0-471-98501-5.
3. KLOUDA, Pavel. Moderní analytické metody. Třetí, upravené vydání. Ostrava: Pavel Klouda - nakladatelství Pavko, 2016, 176 stran : ilustrace ; 24 cm. ISBN 978-80-86369-22-8.
4. FRANK, Luděk a Jaroslav KRÁL. Metody analýzy povrchů: iontové, sondové a speciální metody. Praha: Academia, 2002, 489 s. ISBN 80-200-0594-3.
Literature - recommended:
1. BRIGGS, D. (David) a John T. GRANT. Surface analysis by auger and X-ray photoelectron spectroscopy. Chichester: Manchester: IM Publications ; SurfaceSpectra, 2003, xi, 899 stran : ilustrace, tabulky, grafy. ISBN 1-901019-04-7.
2. KAUPP, Gerd. Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces. Berlin: Springer, 2006, vii, 292 s. : il. ISBN 3-540-28405-2.
3. LAJUNEN, Lauri H.J. Spectrochemical Analysis by Atomic Absorption and Emission. Cambridge: The Royal Society of Chemistry, 1992, 241 s. ISBN 0-85186-873-8.
The study programmes with the given course:
Programme Study form Branch Spec. Final classification   Course-unit credits     Obligation     Level     Year     Semester  
M2A-P full-time study M-MTI Materials Engineering -- GCr 5 Compulsory 2 2 W