Theory of Measurements, Measurement Techniques and Technical Diagnostics (FSI-9TTD)

Academic year 2020/2021
Supervisor: doc. Ing. Stanislav Průša, Ph.D.  
Supervising institute: ÚFI all courses guaranted by this institute
Teaching language: Czech or English
Aims of the course unit:
Describe physical principles of selected measuring methods and measuring equipments.
Learning outcomes and competences:
Understanding of selected physical principles and their application in measurements, sensors and equipments.
Prerequisites:
Successful completion of the course is conditional on the knowledge and skills acquired in the courses "Physics I", "Physics II", "Metrological Physics".
Course contents:
The course introduces students to the theory of advanced measurement techniques and measuring systems with nanometer resolution.
Teaching methods and criteria:
The course is taught through lectures explaining the basic principles and theory of the discipline.
Assesment methods and criteria linked to learning outcomes:
An examination composed from oral and written part.
Controlled participation in lessons:
Participation at every course parts.
Type of course unit:
    Lecture  10 × 2 hrs. optionally                  
Course curriculum:
    Lecture General definitions and theory. Statistics and data processing: classification of random parameters (Gaussian and uniform distribution). Law of error propagation. Experimental data processing.

Sensors: general classification, capacity sensors, sensors based on induction.

Advanced methods of visualisation and diagnostics: scanning electron microscopy, atomic force microscopy, scanning tunnelling microscopy.
Literature - fundamental:
1. DOEBELIN, O.D.: Measurement Systems. Application and Design.. New York: McGraw-Hill, 1990.
2. ORNATSKIJ, P.P.: Teoretičeskije osnovy informacionno-izměritělnoj techniki. Kijev: Vyšča škola, 1976.
3. Normy: Mezinárodní slovník základních a všeobecných termínů v metrologii.. ČSN 01 0115
4. BOX, G.E.P., HUNTER, W.G., HUNTER, J.S. Statistics for Experiments-an Introduction to Design, Data Analysis and Model Building, Wiley 1978
5. RIPKA, P.; TIPEK, A. Master Book of Sensors, part A, part B, Czech Technical University, 2003
6. WIESENDAGER. R., GUNTHERODT. J.H.: Scanning Tuneling Microscopy II, Springer 1995
7. REIMER, L, Scanning Electron Microscopy (2nd ed.), Springer,1998
8. WILIAMS, D. B., CARTER, C. B. Transmission Electron Microscopy (2nd ed.), Springer, 2009
Literature - recommended:
1. DOEBELIN, O.D.: Measurement Systems. Application and Design.. New York: McGraw-Hill, 1990.
2. Normy: Vyjadřování nejistoty při měření.
3. JENČÍK, J., KUHN, L. a další: Technická měření ve strojírenství.. Praha: SNTL, 1982.
The study programmes with the given course:
Programme Study form Branch Spec. Final classification   Course-unit credits     Obligation     Level     Year     Semester  
D4P-P full-time study D-APM Applied Mathematics -- DrEx 0 Recommended course 3 1 W
D-APM-K combined study --- -- DrEx 0 Recommended course 3 1 W