Diagnostics of Nanostructures (FSI-TDN-A)

Academic year 2020/2021

Supervisor:	doc. Ing. Radek Kalousek, Ph.D.
Supervising institute:	ÚFI	all courses guaranted by this institute
Teaching language:	English
Aims of the course unit:
The goal is to give an overview of the methods providing the diagnostics of 1D and 0D nanostructures concerning both their morphological and structural characteristics and their local electronic, optical, electrical and magnetic properties as well.
Learning outcomes and competences:
Students will learn the current status of a new field called Diagnostics of Nanostructures which will also be of assistance to them for the selection of their diploma and doctoral theses.
Prerequisites:
Elementary Physics, Quantum Physics, Solid State Physics, Surfaces and Thin Films.
Course contents:
The subject is aimed at the explanation of physical principles of diagnostics of 1D and 2D nanostructures suitable for a study of morphological and structural parameters, as well as of their local properties. The individual methods, fundamentals of their selection and optimization with respect with their lateral resolution will be described. In addition to scanning probe microscopic metods (STM, AFM, EFM, MFM, SNOM, etc.) and electron and ion microscopy (TEM, SEM, etc.) also optical microscopic spectroscopic techniques (e.g. confocal scanning Raman spectroscopy and photoluminiscence) and their combination will be discussed (STL, cathodoluminiscence, TERS, etc.). These methods will be demonstrated and tested as well.
Teaching methods and criteria:
The course is taught through lectures explaining the basic principles and theory of the discipline. Exercises are focused on practical topics presented in lectures. Teaching is suplemented by practical laboratory work.
Assesment methods and criteria linked to learning outcomes:
The assessment of a student is made upon his performance in practice and quality of a discussion on topics selected at the colloquium (lecture notes allowed at preparation).
Controlled participation in lessons:
The presence of students at practice is obligatory and is monitored by the tutor. The way how to compensate missed practice lessons will be determined by the tutor depending on the extent and content of the missed lessons.
Type of course unit:
Lecture	13 × 1 hrs.	optionally
Laboratory exercise	3 × 2 hrs.	compulsory
Exercise	7 × 2 hrs.	compulsory
Computer-assisted exercise	3 × 2 hrs.	compulsory
Course curriculum:
Lecture	Introduction to Scanning Probe Microscopy (SPM); Scanning Tunneling Microscopy (STM) - principles of imaging by tunneling current and operation modes; scanning force microscopy (SFM) - relevant forces and operation modes; atomic force microscopy (AFM), magnetic force microscopy (MFM), electric force microscopy (EFM) and Kelvin force microscopy (KFM); scanning near field optical microscopy (SNOM); other types of SPM; principles of SPM design; electron and ion microscopy and spectroscopy (TEM/EELS, SEM/SAM,aj.); optical microscopy and spectroscopy (e.g. confocal scanning Raman spectroscopy and photoluminiscence); combined methods (STL, cathodoluminiscence, TERS, etc.).

Laboratory exercise	See seminars.

Exercise	The calculation of supportive theoretical examples and practical demonstrations and testing take place during the whole semester.

Computer-assisted exercise	See seminars.

Literature - fundamental:
1. Stroscio A., Keiser W. J.: Scanning Tunneling Microscopy, Academic Press, Inc., 1993.
2. Meyer E., Hug H. J.: Scanning Probe Microscopy, The Lab on a Tip, Springer , 2004.