Academic year 2018/2019 |
Supervisor: | prof. RNDr. Tomáš Šikola, CSc. | |||
Supervising institute: | ÚFI | |||
Teaching language: | Czech | |||
Aims of the course unit: | ||||
The students build experience on experimental activities, data collecting and processing, and analysis and interpretation of results. | ||||
Learning outcomes and competences: | ||||
Ability to independently carry out experiments with a knowledge of theoretical aspects of the problem. | ||||
Prerequisites: | ||||
Atomic Physics, Solid State Physics, Quantum Physics, Statistical Physics and Thermodynamics, Vacuum Physics and Technology, Geometrical and Wave Optics. | ||||
Course contents: | ||||
The practice consists of advanced laboratory experiments and to meet its tasks students must undergo a complex theoretical preparation. The individual experiments address the fields of vacuum physics and techniques, light optics, ion and electron optics, physical technologies and analysis and measurements of properties of solid state materials. | ||||
Teaching methods and criteria: | ||||
The course is taught through practical laboratory work. | ||||
Assesment methods and criteria linked to learning outcomes: | ||||
The assessment of a student is made upon his reports on performed experiments and subsequent discussions of the results achieved. The student goes through all experiments. If justified, some experiments might be also done or repeated out of an initial official schedule. | ||||
Controlled participation in lessons: | ||||
The presence of students at practice is obligatory and is monitored by a tutor. The way how to compensate missed practice lessons will be decided by a tutor depending on the range and content of the missed lessons. | ||||
Type of course unit: | ||||
Labs and studios | 13 × 3 hrs. | compulsory | ||
Course curriculum: | ||||
Labs and studios | Problem 1: Scanning Electron Microscopy (SEM) Problem 2: Scanning tunneling microscopy (STM) Problem 3: Atomic Force Microscopy (AFM) Problem 4: X-ray diffraction spectroscopy Problem 5: Measurement of I/V characteristics Problem 6: Measurement of magnetic susceptibility |
|||
Literature - fundamental: | ||||
1. ECKERTOVÁ, L.: Diagnostics of Thin Films | ||||
2. BROŽ, J.: Základy fyzikálních měření | ||||
Literature - recommended: | ||||
1. Autoři jednotlivých úloh: sylaby k jednotlivým úlohám |
The study programmes with the given course: | |||||||||
Programme | Study form | Branch | Spec. | Final classification | Course-unit credits | Obligation | Level | Year | Semester |
B3A-P | full-time study | B-FIN Physical Engineering and Nanotechnology | -- | GCr | 3 | Compulsory | 1 | 3 | S |
Faculty of Mechanical Engineering
Brno University of Technology
Technická 2896/2
616 69 Brno
Czech Republic
+420 541 14n nnn
+420 726 81n nnn – GSM Telef. O2
+420 604 07n nnn – GSM T-mobile
Operator: nnnn = 1111