Microscopy and Spectroscopy (FSI-TMK)

Academic year 2020/2021
Supervisor: prof. RNDr. Radim Chmelík, Ph.D.  
Supervising institute: ÚFI all courses guaranted by this institute
Teaching language: Czech
Aims of the course unit:
The goal of the course is to provide students an overview of the principle and methods of light microscopy and spectroscopy, and of particle spectroscopy and give them practical experience with relevant devices.
Learning outcomes and competences:
Students will learn about the history and modern techniques and approaches in the field of light microscopy and spectroscopies (light and particle) and fundamental practical experience with relevant devices. Among others, it help them to select their own topic (for diploma or doctoral thesis).
Prerequisites:
Elementary Physics, Quantum Physics, Solid State Physics, Surfaces and Thin Films, Geometrical and wave optics.
Course contents:
Introduction to light microscopy (historical overview completed by substantial pieces of knowledge of geometric and wave optics, light-microscope optical setup, basic techniques of light microscopy and practical knowledge), theoretical description of image formation (wave theory of image formation based on the Abbe theory), confocal microscopy (principle, setup of the device, imaging properties), fluorescence microscopy (principle, setup of the device, imaging properties), interference and holographic microscopy (principle, setup of the device, imaging properties), spectroscopic methods, X-ray photoelectron spectroscopy (XPS, principle, setup of the device, parameters), secondary ion mass spectrometry (SIMS, principle, setup of the device, parameters), low-energy ion scattering spectroscopy (LEIS, principle, setup of the device, parameters).
Demonstrations and practical exercises on light microscopy and spectroscopy and on particle spectroscopy are carried out in laboratories.


Teaching methods and criteria:
The course is taught through lectures explaining the basic principles and theory of the discipline. Teaching is suplemented by practical laboratory work.
Assesment methods and criteria linked to learning outcomes:
The assessment of a student is made upon his performance in written and oral part of the exam.
Controlled participation in lessons:
The presence of students is monitored by the tutor. Maximum of tolerated absence is 25 %.
Type of course unit:
    Lecture  13 × 2 hrs. optionally                  
    Laboratory exercise  13 × 1 hrs. compulsory                  
Course curriculum:
    Lecture Introduction to microscopy
Theory of imaging
Confocal microscopy
Fluorescence microscopy
Interference and holographic microscopy
Spectroscopic methods
X-ray photoelectron spectroscopy (XPS)
Secondary ion mass spectrometry (SIMS)
Low-energy ion scattering spectroscopy (LEIS)
    Laboratory exercise The calculations of supportive theoretical examples take place during the whole semester. Demonstrations and practical exercises in laboratory of optical microscopy, in laboratory of surfaces and thin films.
Literature - fundamental:
1. D. B. Murphy, M.W. Davidson: Fundamentals of light microscopy and electronic imaging. Wiley‐Blackwell 2012.
2. A. R. Hibbs: Confocal Microscopy for Biologists. Springer, 2004.
3. H. Kuzmany: Solid-state spectroscopy. Springer, 2009.
4. H. Friedrich: Scattering Theory. Springer, Heidelberg, New York, Dordrecht, London 2013.
5. R. Chmelík: Materiály do praktika předmětu Mikroskopie a spektroskopie. Elektronický studijní text, Brno, 2014.
6. E. Keprt: Teorie optických přístrojů 2, Teorie a konstrukce mikroskopu, SPN, Praha 1966.
7. Internetové zdroje: http://micro.magnet.fsu.edu/primer http://microscopyu.com
Literature - electronic:
1. http://micro.magnet.fsu.edu/primer
The study programmes with the given course:
Programme Study form Branch Spec. Final classification   Course-unit credits     Obligation     Level     Year     Semester  
N-FIN-P full-time study --- no specialisation -- Cr,Ex 5 Compulsory 2 2 W
M2A-P full-time study M-PMO Precise Mechanics and Optics -- Cr,Ex 5 Compulsory 2 2 W