Imaging and Diagnostics of Nanostructures (FSI-9ZDN)

Academic year 2020/2021
Supervisor: prof. RNDr. Jiří Spousta, Ph.D.  
Supervising institute: ÚFI all courses guaranted by this institute
Teaching language: Czech
Aims of the course unit:
The aim of the course is to provide a survey of various methods for imaging and diagnostics of 1D and 0D nanostructures not only from the morphological and structural point of view, but also making possible to measure local electronic, optical, transport, and magnetic properties of nanostructures.
Learning outcomes and competences:
PhD student is offered to acquire an overview on current knowledge and contemporary methods used in the modern field of Diagnostics of nanostructures.
Prerequisites:
Knowledge on fundamentals of quantum mechanics, theory of electromagnetic field, and solid state physics is expected.
Course contents:
Scanning probe microscopy; optical microscopy; electron microscopy; methods for imaging of chemical contrast; combined methods
Teaching methods and criteria:
Classes will have form of series of lectures, alternatively group or individual consultations.
Assesment methods and criteria linked to learning outcomes:
The course is completed with discussion especially on questions associated with topics of the PhD thesis.
Controlled participation in lessons:
The attendance is checked.
Type of course unit:
    Lecture  10 × 2 hrs. compulsory                  
Course curriculum:
    Lecture Introduction to scanning probe microscopy (SPM); scanning tunneling microscopy (STM) – principles of imaging using tunneling current and measurement modes; scanning force microscopy (SFM) – types of forces and measurement modes; atomic force microscopy (AFM); magnetic force microscopy (MFM); electric force microscopy (EFM) and Kelvin probe force microscopy (KPFM); scanning near-field optical microscopy (SNOM); other types of SPM; principles of construction of SPM; electron and ion microscopy and spectroscopy (TEM/EELS, SEM/SAM, etc.); optical and spectroscopic methods (e.g. confocal scanning Raman spectroscopy and photoluminescence spectroscopy and photoluminescence); X-ray photoelectron spectroscopy (XPS); secondary ion mass spectrometry (SIMS); low energy ion scattering (LEIS); combined methods (e.g. STL, cathodoluminescence, TERS, etc.).
Literature - fundamental:
1. A. Stroscio, W. J. Keiser: Scanning Tunneling Microscopy. Academic Press Inc., 1993.
2. E. Meyer, H. J. Hug: Scanning Probe Microscopy: The Lab on a Tip. Springer, 2004.
3. L. Novotny, B. Hecht: Principles of Nano-Optics. Cambridge University Press 2006.
4. L. Reimer: Scanning Electron Microscopy: Physics of Image Formation and Microanalysis. Springer, 1998.
5. D. B. Williams, C. B. Carter: Transmission Electron Microscopy: A Textbook for Material Science. Springer, 2009.
6. P. van der Heide: X-ray Photoelectron Spectroscopy: An introduction to Principles and Practices. Wiley, 2011.
7. P. van der Heide: Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices. Wiley, 2014.
8. J. W. Rabalais: Principles and Applications of Ion Scattering Spectrometry: Surface Chemical and Structural Analysis. Wiley, 2002.
The study programmes with the given course:
Programme Study form Branch Spec. Final classification   Course-unit credits     Obligation     Level     Year     Semester  
D4F-P full-time study D-FMI Physical and Materials Engineering F Physical Engineering DrEx 0 Recommended course 3 1 W