prof. RNDr. Jiří Spousta, Ph.D.

E-mail:   spousta@fme.vutbr.cz 
Dept.:   Institute of Physical Engineering
Dept. of Physics of Surfaces and Nanostructures
Position:   Professor
Room:   A1/1334

Education and academic qualification

  • 1986: RNDr. - graduated with felicitation from University of Jan Evangelista Purkyně Brno (present-day Masaryk University), Faculty of Science, physics,.
  • 1994: PhD. study – Université Paris 7: Etudes de la croissance des couches de carbone amorphe hydrogéné
  • 2002: associate professor - Faculty of Science Masaryk University of Brno
  • 2008: professor of applied physics, Brno University of Technology.
  • Professional Stages:
  • 1986 - 1988: Zbrojovka Brno, hard discs magnetic media development
  • 1988 - 2002: lecturer at Department of Physics (present-day Department of Physical Engineering), Faculty of Mechanical Engineering, Brno University of Technology,
  • 1991 - 1994: PhD study at Université Paris 7, France
  • 2002 - 2008: associate professor at Department of Physical Engineering,
  • 2008 - till now: professor at Department of Physical Engineering, Faculty of Mechanical Engineering, Brno University of Technology.

Career overview

  • 1986 - 1988: Zbrojovka Brno Enterprise, magnetic discs,
  • 1988 - 2002: lecturer FSI VUT v Brně,
  • 1991 - 1994: PhD study at Université Paris 7, France
  • 2002 - 2008: associate professor at ÚFI FSI VUT,
  • 2008 - till now: professor at ÚFI FSI VUT

Scientific activities

  • Surface Science, Thin Film Physics, Nanotechnology
  • Modification of surfaces and etching of microstructures/nanostructures by ion beams
  • Development and application of ion beam assisted deposition technique (IBAD) for preparation of metal, oxide and nitride thin films and multilayers
  • Development and application of ultravacuum (UHV) equipment for ion assisted molecular beam deposition (Ga, GaN)
  • Application of SPM (STM/AFM) for fabrication of nanostructures
  • Study of electric and photonic properties of nanostructures
  • Development and application of in situ analytical and microscopic methods Study of interaction of SPM local probes with surfaces
  • UHV technique

Projects

  • 1995 - 1996 grant FSI No.: FP 369551: In situ measurements of optical thickness of thin films,
  • 1997 - 2000 French-Czech projects Barrande I, II: Deposition of magnetic thin films by IBAD and their characterization,
  • 1998 - 2000 GAČR 101/98/0772: Design and construction of an optical apparatus for in situ measurements of optical homogeneity of thin films,
  • 2002 - 2004 GAČR 102/02/0506: Design and construction of an Ultra-violet optical apparatus for in situ measurements of areal optical homogeneity of thin films prepared by IBAD,
  • 2005 - 2010 Inorganic nanomaterials and nanostructures,
  • 2004 - 2008 Nanoscience and nanotechnology by probe microscopes: from atomic scale phenomena to material properties,
  • 2007 - 2011 Functional hybrid nanosystems of semiconductors and metals with organic materials (FUNS).

Sum of citations (without self-citations) indexed within SCOPUS

156

Sum of citations (without self-citations) indexed within ISI Web of Knowledge

219

Sum of other citations (without self-citations)

Supervised courses:

Publications:

  • DVOŘÁK, P.; LIGMAJER, F.; ŠAMOŘIL, T.; HRTOŇ, M.; KLEMENT, R.; BABOCKÝ, J.; TUČEK, M.; SPOUSTA, J.; ŠIKOLA, T.:
    Využití reflexní optické spektroskopie v plazmonice,
    Jemná mechanika a optika, Vol.59, (2014), No.6-7, pp.162-164, ISSN 0447-6441
    journal article - other
  • UHLÍŘ, V.; URBÁNEK, M.; HLADÍK, L.; SPOUSTA, J.; IM, M.; FISCHER, P.; EIBAGI, N.; KAN, J.; FULLERTON, E.; ŠIKOLA, T.:
    Dynamic switching of the spin circulation in tapered magnetic nanodisks,
    Nature Nanotechnology (print), Vol.8, (2013), No.5, pp.341-346, ISSN 1748-3387
    journal article - other
  • SPOUSTA, J.; PRŮŠA, S.; TROJÁNEK, A.; DUB, P.:
    Kvalitní učebnice fyziky - důležitá opora výuky,
    Československý časopis pro fyziku, Vol.62, (2012), No.5-6, pp.421-425, ISSN 0009-0700
    journal article - other
  • MACH, J.; ŠAMOŘIL, T.; VOBORNÝ, S.; KOLÍBAL, M.; ZLÁMAL, J.; SPOUSTA, J.; DITTRICHOVÁ, L.; ŠIKOLA, T.:
    An ultra-low energy (30–200 eV) ion-atomic beam source for ion-beam-assisted deposition in ultrahigh vacuum,
    Review of Scientific Instruments, Vol.82, (2011), No.8, pp.083302-1-083302-7, ISSN 0034-6748
    journal article - other
  • LYSÁČEK, D.; VÁLEK, L.; SPOUSTA, J.; ŠIKOLA, T.; ŠPETÍK, R.:
    Thermal stability of undoped polycrystalline silicon layers on antimony and boron-doped substrates,
    Thin Solid Films, Vol.518, (2010), No.14, pp.4052-4057, ISSN 0040-6090
    journal article - other
  • URBÁNEK, M.; UHLÍŘ, V.; BÁBOR, P.; KOLÍBALOVÁ, E.; HRNČÍŘ, T.; SPOUSTA, J.; ŠIKOLA, T.:
    Focused ion beam fabrication of spintronic nanostructures: an optimization of the milling process,
    NANOTECHNOLOGY, Vol.21, (2010), No.14, pp.145304-1-145304-7, ISSN 0957-4484
    journal article - other

List of publications at Portal BUT

Abstracts of most important papers:

  • DVOŘÁK, P.; LIGMAJER, F.; ŠAMOŘIL, T.; HRTOŇ, M.; KLEMENT, R.; BABOCKÝ, J.; TUČEK, M.; SPOUSTA, J.; ŠIKOLA, T.:
    Využití reflexní optické spektroskopie v plazmonice,
    Jemná mechanika a optika, Vol.59, (2014), No.6-7, pp.162-164, ISSN 0447-6441
    journal article - other

    This article deals with application of reflective optical spectroscopy for experimental studies of plasmonic nanostructers. The optical properties of Localized Surface Plasmons (LSP) are briefly outlined and an experimental setup for their detection and spectral analysis is presented. Furthermore, we also demonstrate experimentally obtained optical spectra of samples fabricated from gold nanoparticles on silicon substrate and compare them with numerical simulations from Lumerical software.
  • UHLÍŘ, V.; URBÁNEK, M.; HLADÍK, L.; SPOUSTA, J.; IM, M.; FISCHER, P.; EIBAGI, N.; KAN, J.; FULLERTON, E.; ŠIKOLA, T.:
    Dynamic switching of the spin circulation in tapered magnetic nanodisks,
    Nature Nanotechnology (print), Vol.8, (2013), No.5, pp.341-346, ISSN 1748-3387
    journal article - other

    Magnetic vortices are characterized by the sense of in-plane magnetization circulation and by the polarity of the vortex core. With each having two possible states, there are four possible stable magnetization configurations that can be utilized for a multibit memory cell. Dynamic control of vortex core polarity has been demonstrated using both alternating and pulsed magnetic fields and currents. Here, we show controlled dynamic switching of spin circulation in vortices using nanosecond field pulses by imaging the process with full-field soft X-ray transmission microscopy. The dynamic reversal process is controlled by far-from-equilibrium gyrotropic precession of the vortex core, and the reversal is achieved at significantly reduced field amplitudes when compared with static switching. We further show that both the field pulse amplitude and duration required for efficient circulation reversal can be controlled by appropriate selection of the disk geometry.
  • URBÁNEK, M.; UHLÍŘ, V.; BÁBOR, P.; KOLÍBALOVÁ, E.; HRNČÍŘ, T.; SPOUSTA, J.; ŠIKOLA, T.:
    Focused ion beam fabrication of spintronic nanostructures: an optimization of the milling process,
    NANOTECHNOLOGY, Vol.21, (2010), No.14, pp.145304-1-145304-7, ISSN 0957-4484
    journal article - other

    Focused ion beam (FIB) milling has been used to fabricate magnetic nanostructures (wires, squares, discs) from single magnetic layers (Co, permalloy) and spin-valve (permalloy/Cu/Co) multilayers (thicknesses 5 - 50 nm) prepared by ion beam sputtering deposition. Milled surfaces of metallic thin films typically exhibit residual roughness, which is also transferred onto the edges of the milled patterns. This can lead to domain wall pinning and influence the magnetization behaviour of the nanostructures. We have investigated the milling process and the influence of the FIB parameters (incidence angle, dwell time, overlap and ion beam current) on the roughness of the milled surface. It has been found that the main reasons for increased roughness are different sputter yields for various crystallographic orientations of the grains in polycrystalline magnetic thin films. We have found that the oblique ion beam angle, long dwell time and overlap <1 are favourable parameters for suppression of this intrinsic roughness. Finally, we have shown how to determine the ion dose necessary to mill through the whole thin film up to the silicon substrate from scanning electron microscopy (SEM) images only.
  • URBÁNEK, M.; SPOUSTA, J.; BĚHOUNEK, T.; ŠIKOLA, T.:
    Imaging reflectometery in situ,
    Applied Optics, Vol.46, (2007), No.25, pp.6309-6313, ISSN 0003-6935
    journal article - other

    An innovative method of in situ real-time optical monitoring of thin film deposition and etching is presented. In this technique, intensity maps of a thin film corresponding to a series of wavelengths selected by a monochromator 300 - 800 nm are recorded by a CCD camera. From the maps the reflectance spectra at individual points of the sample surface can be extracted. By fitting the reflectance spectra to the theoretical ones, the maps of a thin film morphology (including optical parameters) and their temporal development during technological processes can be obtained. The method was tested by in situ observation of the growth of silicon nitride and silicon oxide thin films prepared by ion beam sputtering and by the monitoring of etching of thermally grown SiO2 thin films.
  • SPOUSTA, J., GERRI, M., ICABARROCAS, P., MARINE, V.:
    Excimer-laser-assisted rf glow discharge deposition of amorphous and microcrystalline silicon thin films,
    Applied Physics A - Solids and Surfaces, Vol.1994, (1994), No.58, pp.545
    journal article - other