doc. Ing. Miroslav Kolíbal, Ph.D.

E-mail:   kolibal.m@fme.vutbr.cz 
Dept.:   Institute of Physical Engineering
Position:   Associate Professor
Room:   A1/1726

Education and academic qualification

  • 2017, habilitation in Applied physics, Faculty of Mechanical Engineering, Brno University of Technology
  • 2009, PhD., Fakulta strojního inženýrství VUT v Brně, obor Fyzikální a materiálové inženýrství
  • 2002, Ing., Fakulta strojního inženýrství VUT v Brně, obor Fyzikální a materiálové inženýrství

Career overview

09/2017 – present: associate professor, Faculty of Mechanical Engineering, Brno University of Technology

02/2012 –present: senior researcher, Central European Institite of Technology, Brno University of Technology

04/2011 – present: Thermo Fisher Scientific, external consultant

02/2009 – 08/2017: assistant professor, Faculty of Mechanical Engineering, Brno University of Technology 

07/2008 – 01/2009: assistant, Faculty of Mechanical Engineering, Brno University of Technology 

10/2005 – 06/2008: technical staff, Faculty of Mechanical Engineering, Brno University of Technology 

Scientific activities

  • Development of instrumentation and methodology for monitoring chemical reactions in real time in an electron microscope
  • Multimodal microscopy including other signals than electrons only (e.g. scanning probe microscopy)
  • Preparation and analysis of 1D and 2D nanostructures, including modifications and arrangement into spatially organized functional blocks

Projects

    • Grant Agency of the Czech Republic, junior funding scheme 2016-2018, EUR 223k.
    • Grant Agency of the Czech Republic, postdoctoral funding scheme 2012-2015, EUR 59k

    jako co-investigator or similar important role

    • Technology Agency of the Czech Republic, programme Epsilon, TH03020005, “R&D of Bulk Semiconductor Material with Wide Bandgap”, 2018-2020.
    • Technology Agency of the Czech Republic, programme Zeta, TJ01000271, “Development of atomic source for applications in electron microscopy” 2018-2019.
    • Technology Agency of the Czech Republic, programme Trend, FW01010183, “Next Generation of Integrated Atomic Force and Scanning Electron Microscopy”, 2020-2023.
    • Technology Agency of the Czech Republic, programme Národní centra competence, TN01000008, “Center of electron and photonic optics” 2018-2022.

Sum of citations (without self-citations) indexed within SCOPUS

Supervised courses:

Publications:

  • KOLÍBAL, M.; VYSTAVĚL, T.; VARGA, P.; ŠIKOLA, T.:
    Real-Time Observation of Collector Droplet Oscillations during Growth of Straight Nanowires
    journal article in Web of Science
  • KOLÍBAL, M.; KONEČNÝ, M.; LIGMAJER, F.; ŠKODA, D.; VYSTAVĚL, T.; ZLÁMAL, J.; VARGA, P.; ŠIKOLA, T.:
    Guided Assembly of Gold Colloidal Nanoparticles on Silicon Substrates Prepatterned by Charged Particle Beams
    journal article in Web of Science
  • KOLÍBAL, M.; KALOUSEK, R.; NOVÁK, L.; VYSTAVĚL, T.; ŠIKOLA, T.:
    Controlled faceting in (110) germanium nanowire growth by switching between vapor-liquid-solid and vapor-solid-solid growth
    journal article in Web of Science
  • KOLÍBAL, M.; VYSTAVĚL, T.; NOVÁK, L.; MACH, J.; ŠIKOLA, T.:
    In-situ observation of <110> oriented Ge nanowire growth and associated collector droplet behavior
    journal article in Web of Science
  • KOLÍBAL, M.; MATLOCHA, T.; VYSTAVĚL, T.; ŠIKOLA, T.:
    Low energy focused ion beam milling of silicon and germanium nanostructures,
    NANOTECHNOLOGY, Vol.22, (2011), No.10, pp.105304-1-105304-8, ISSN 0957-4484
    journal article - other
  • KOLÍBAL, M.; ČECHAL, J.; BARTOŠÍK, M.; MACH, J.; ŠIKOLA, T.:
    Stability of hydrogen-terminated silicon surface under ambient atmosphere,
    Applied Surface Science, Vol.256, (2010), No.11, pp.3423-2426, ISSN 0169-4332
    journal article - other
  • KOLÍBAL, M.; ČECHAL, T.; KOLÍBALOVÁ, E.; ČECHAL, J.; ŠIKOLA, T.:
    Self-limiting cyclic growth of gallium droplets on Si(111),
    NANOTECHNOLOGY, Vol.19, (2008), No.46, pp.475606-1-475606-5, ISSN 0957-4484
    journal article - other
  • MACH, J.; ČECHAL, J.; KOLÍBAL, M.; POTOČEK, M.; ŠIKOLA, T.:
    Atomic hydrogen induced gallium nanocluster formation on the Si(100) surface,
    Surface Science, Vol.602, (2008), No.10, pp.1898-1902, ISSN 0039-6028
    journal article - other
  • KOLÍBAL, M.; TOMANEC, O.; PRŮŠA, S.; PLOJHAR, M.; MARKIN, S.; DITTRICHOVÁ, L.; SPOUSTA, J.; BAUER, P.; ŠIKOLA, T.:
    TOF-LEIS spectra of Ga/Si: Peak shape analysis,
    Nuclear Instruments and Methods in Physics Research B, Vol.265, (2007), No.2, pp.569-575, ISSN 0168-583X
    journal article - other
  • KOLÍBAL, M.; PRŮŠA, S.; PLOJHAR, M.; BÁBOR, P.; POTOČEK, M.; TOMANEC, O.; KOSTELNÍK, P.; MARKIN, S.; BAUER, P.; ŠIKOLA, T.:
    In situ Analysis of Ga-ultra Thin Films by ToF-LEIS,
    Nuclear Instruments and Methods in Physics Research B, Vol.249, (2006), No.1-2, pp.318-321, ISSN 0168-583X, Elsevier
    journal article - other
  • KOLÍBAL, M.; PRŮŠA, S.; BÁBOR, P.; ŠIKOLA, T.:
    Low energy ion scattering as a method for surface structure analysis,
    Jemná mechanika a optika, Vol.9, (2004), No.9, pp.262-265, ISSN 0447-6441
    journal article - other
  • KOLÍBAL, M.; PRŮŠA, S.; BÁBOR, P.; ŠIKOLA, T.:
    ToF-LEIS Analysis of ultra thin films: Ga and Ga-N layer growth on Si(111),
    Surface Science, Vol.566-568, (2004), No.9, pp.885-889, ISSN 0039-6028
    journal article - other

List of publications at Portal BUT

Abstracts of most important papers:

  • KOLÍBAL, M.; KONEČNÝ, M.; LIGMAJER, F.; ŠKODA, D.; VYSTAVĚL, T.; ZLÁMAL, J.; VARGA, P.; ŠIKOLA, T.:
    Guided Assembly of Gold Colloidal Nanoparticles on Silicon Substrates Prepatterned by Charged Particle Beams
    journal article in Web of Science

    Colloidal gold nanoparticles represent technological building blocks which are easy to fabricate while keeping full control of their shape and dimensions. Here, we report on a simple two-step maskless process to assemble gold nanoparticles from a water colloidal solution at specific sites of a silicon surface. First, the silicon substrate covered by native oxide is exposed to a charged particle beam (ions or electrons) and then immersed in a HF-modified solution of colloidal nanoparticles. The irradiation of the native oxide layer by a low-fluence charged particle beam causes changes in the type of surface-terminating groups, while the large fluences induce even more profound modification of surface composition. Hence, by a proper selection of the initial substrate termination, solution pH, and beam fluence, either positive or negative deposition of the colloidal nanoparticles can be achieved
  • KOLÍBAL, M.; KALOUSEK, R.; NOVÁK, L.; VYSTAVĚL, T.; ŠIKOLA, T.:
    Controlled faceting in (110) germanium nanowire growth by switching between vapor-liquid-solid and vapor-solid-solid growth
    journal article in Web of Science

    We show that the hexagonal cross-section of germanium nanowires grown in the (110) direction by physical vapor deposition is a consequence of minimization of surface energy of the collector droplet. If the droplet is lost or solidified, two (001) sidewall facets are quickly overgrown and the nanowire exhibits a rhomboidal cross-section. This process can be controlled by switching between the liquid and solid state of the droplet, enabling the growth of nanowires with segments having different cross-sections. These experiments are supported by in-situ microscopic bservations and theoretical model
  • KOLÍBAL, M.; VYSTAVĚL, T.; NOVÁK, L.; MACH, J.; ŠIKOLA, T.:
    In-situ observation of <110> oriented Ge nanowire growth and associated collector droplet behavior
    journal article in Web of Science

    Using in-situ microscopy, we show that germanium nanowires can be grown by a vapor-liquid-solid process in h110i directions both on Ge(100) and Ge(111) substrates if very low supersaturation in the collector droplet is ensured. This can be provided if thermal evaporation is utilized. Such a behavior is also in agreement with earlier chemical vapor deposition experiments, where h110i oriented wires were obtained for very small wire diameters only. Our conclusions are supported by in-situ observations of nanowire kinking towards h111i direction occurring more frequently at higher evaporation rates
  • KOLÍBAL, M.; MATLOCHA, T.; VYSTAVĚL, T.; ŠIKOLA, T.:
    Low energy focused ion beam milling of silicon and germanium nanostructures,
    NANOTECHNOLOGY, Vol.22, (2011), No.10, pp.105304-1-105304-8, ISSN 0957-4484
    journal article - other

    In this paper focused ion beam milling of very shallow nanostructures in silicon and germanium by low energy Ga+ ions is studied with respect to ion beam and scanning parameters. It has been found that, using low energy ions, many scanning artefacts can be avoided and, additionally, some physical effects (e.g. redeposition and ion channelling) are significantly suppressed. The structures milled with low energy ions suffer less subsurface ion beam damage (amorphization, formation of voids) and are thus more suitable for selected applications in nanotechnology.
  • KOLÍBAL, M.; ČECHAL, J.; BARTOŠÍK, M.; MACH, J.; ŠIKOLA, T.:
    Stability of hydrogen-terminated silicon surface under ambient atmosphere,
    Applied Surface Science, Vol.256, (2010), No.11, pp.3423-2426, ISSN 0169-4332
    journal article - other

    In this paper a comparative study of different wet-chemical etching procedures of vicinal Si(1 1 1) surface passivation is presented. The stability against oxidation under ambient atmosphere was studied by X-ray photoelectron spectroscopy and atomic force microscopy. The best results were achieved by the buffered HF etching and the final smoothing of the surface by hot (72 C) NH4F. The procedures consisting of a large number of etching steps were unsatisfactory, since the probability of contamination during each step was increasing. The passivated surface was stable against oxidation for at least 3 h under ambient atmosphere.