doc. Ing. Stanislav Průša, Ph.D.
E-mail:   prusa@fme.vutbr.cz  WWW:   http://physics.fme.vutbr.cz/ufi.php?Action=0&Id=159 Dept.:   Institute of Physical Engineering Dept. of Physics of Surfaces and Nanostructures Position:   Associate Professor Room:   A2-old/512

Supervised courses:

• Advanced Experimental Methods I (TS)
• MEMS and NEMS Systems (TSY)
• Physical Laboratory II (TR2)
• Physical Laboratory III (TR3)
• Physics I (2F)
• Physics I (2F-A)
• Principles of Measurement in Engineering (1ZM)
• Theory of Measurement, Techniques of Measurement and Technical Diagnostics (DSD08)
• Theory of Measurements, Measurement Techniques and Technical Diagnostics (9TTD)
• (DSNB08)

Publications:

• SPOUSTA, J.; PRŮŠA, S.; TROJÁNEK, A.; DUB, P.:
  Kvalitní učebnice fyziky - důležitá opora výuky,
  Československý časopis pro fyziku, Vol.62, (2012), No.5-6, pp.421-425, ISSN 0009-0700
  journal article - other
• JULIŠ, M.; KUSMIČ, D.; POSPÍŠILOVÁ, S.; PRŮŠA, S.; OBRTLÍK, K.; DLUHOŠ, J.; PODRÁBSKÝ, T.:
  Study of Surface Relief Evolution in Cyclically Strained Superalloy IN738LC Using advanced Experimental Techniques,
  Chemické listy, Vol.105, (2011), No.S, pp.814-815, ISSN 0009-2770, Chemické listy
  journal article - other
• BÁBOR, P.; DUDA, R.; PRŮŠA, S.; MATLOCHA, T.; KOLÍBAL, M.; ČECHAL, J.; URBÁNEK, M.; ŠIKOLA, T.:
  Depth resolution enhancement by combined DSIMS and TOF-LEIS profiling,
  Nuclear Instruments and Methods in Physics Research B, Vol.269, (2011), No.3, pp.369-373, ISSN 0168-583X
  journal article - other
• MATLOCHA, T.; PRŮŠA, S.; KOLÍBAL, M.; BÁBOR, P.; PRIMETZHOFER, D.; MARKIN, S.; BAUER, P.; ŠIKOLA, T.:
  A study of a LEIS azimuthal scan behavior: Classical dynamics simulation,
  Surface Science, Vol.604, (2010), No.21-22, pp.1906-1911, ISSN 0039-6028
  journal article - other
• POLČÁK, J.; ČECHAL, J.; BÁBOR, P.; URBÁNEK, M.; PRŮŠA, S.; ŠIKOLA, T.:
  Angle-resolved XPS depth profiling of modeled structures: testing and improvement of the method,
  Surface and Interface Analysis, Vol.42, (2010), No.5-6, pp.649-652, ISSN 0142-2421
  journal article - other

List of publications at Portal BUT

Abstracts of most important papers:

• TOPINKA, S.; PRŮŠA, S.:
  Posílení experimentální činnosti žáků při výuce tématického celku - magnetismus,
  Československý časopis pro fyziku, Vol.62, (2012), No.5-6, pp.413-415, ISSN 0009-0700
  journal article - other
  Contribution deals with the general relationships between practical experimental activity of pupils and process of transfer of knowledge to young generation.
• BÁBOR, P.; DUDA, R.; PRŮŠA, S.; MATLOCHA, T.; KOLÍBAL, M.; ČECHAL, J.; URBÁNEK, M.; ŠIKOLA, T.:
  Depth resolution enhancement by combined DSIMS and TOF-LEIS profiling,
  Nuclear Instruments and Methods in Physics Research B, Vol.269, (2011), No.3, pp.369-373, ISSN 0168-583X
  journal article - other
  A combination of dynamic secondary ion mass spectroscopy (DSIMS) and time-of-flight low-energy ion scattering (TOF-LEIS) has been applied to acquire a composition depth profile of MoSi multilayers. During the sequential Ar+ sputtering secondary ions were monitored while in-between the sputtering cycles the TOF-LEIS spectra of scattered He neutrals were acquired. All the measured TOF-LEIS spectra versus sputtering time were displayed in one bitmap from which the depth profiles for different scattering depths were derived and analyzed. Analyzing the TOF-LEIS spectra of He particles scattered from the areas below the layer altered by ion-beam mixing led to an improvement of the depth resolution. In this way the resolution limits due to mixing phenomena can be overcome. Finally, the direct comparison of the DSIMS and TOF-LEIS depth profiles was carried out.
• MARKIN, S.; PRIMETZHOFER, D.; PRŮŠA, S.; BRUNMAYR, M.; KOWARIK, G.; AUMAYR, F.; BAUER, P.:
  Electronic interaction of very slow light ions in Au: Electronic stopping and electron emission,
  PHYSICAL REVIEW B, Vol.78, (2008), No.19, pp.195122-1-195122-6, ISSN 1098-0121
  journal article - other
  Electronic stopping and ion-induced electron emission during the interaction of slow (v<0.1 a.u.) H+ and D+ ions with polycrystalline Au targets have been investigated. Electronic stopping is deduced from time-of-flight low-energy ion scattering measurements in backscattering geometry using polycrystalline films of several nanometers thick. Current measurements are performed to determine the ion-induced electron emission yield. Both in electronic stopping and in ion-induced electron emission we find a rather sharp, distinctive threshold velocity of ~0.19 a.u. for specific excitation and emission of 5d electrons. Below this threshold the projectiles interact exclusively with the 6s electrons.
• PRŮŠA, S.; KOLÍBAL, M.; BÁBOR, P.; MACH, J.; ŠIKOLA, T.:
  Analysis of thin films by TOF-LEIS,
  ACTA PHYSICA POLONICA A, Vol.111, (2007), No.3, pp.335-341, ISSN 0587-4246
  journal article - other
  In the paper the design and application of a TOF-LEIS instrument built into an UHV complex deposition and analytical apparatus is described. A special attention is aimed at demonstrating the ability of TOF-LEIS to analyse near-to-surface layers of thin films prepared both ex-situ and in-situ. Additionally, the monitoring of diffusion processes close to a sample surface by this technique is presented. It is shown that the broadening of peaks in TOF-LEIS spectra can be attributed to multiple scattering and inelastic losses of ions in deeper layers. As a result of that, the peak width of ultrathin films depends on their thickness.
• DRAXLER, M.; MARKIN, S.; KOLÍBAL, M.; PRŮŠA, S.; ŠIKOLA, T.; BAUER, P.:
  High resolution time-of-flight low energy ion scattering,
  Nuclear Instruments and Methods in Physics Research B, Vol.230, (2005), pp.398-401, ISSN 0168-583X, Elsevier
  journal article - other
  Low energy ion scattering (LEIS) is a well known technique for quantitative composition and structure analysis. Two different detection methods can be used in a LEIS experiment, i.e. an electrostatic analyzer or a time-of-flight (TOF) spectrometer. Both techniques have specific advantages. Nevertheless, the time-of-flight technique surpasses usual electrostatic analyzers used in LEIS in terms of energy resolution.The possibility to measure ions and neutrals, and the better energy resolution permit to study neutralization or charge exchange processes in much more detail. Here we present a TOF LEIS setup with an energy resolution of better than 0.4% for 3 keV He ions and report experimental results for 3 keV He ions backscattered from a polycrystalline Cu target. The resulting ion spectrum shows interesting inherent features, which are analyzed. Possible causes for the appearance of these features are discussed.