Ing. Michal Urbánek, Ph.D.
E-mail:   Michal.Urbanek@ceitec.vutbr.cz  WWW:   http://physics.fme.vutbr.cz/urbanek Dept.:   Institute of Physical Engineering Position:   Assistant Professor Room:   A2-old/512

Supervised courses:

• Advanced Experimental Methods II (TSI)
• Introduction to micro- and nanofabrication (DS132)

Publications:

• BÁBOR, P.; DUDA, R.; PRŮŠA, S.; MATLOCHA, T.; KOLÍBAL, M.; ČECHAL, J.; URBÁNEK, M.; ŠIKOLA, T.:
  Depth resolution enhancement by combined DSIMS and TOF-LEIS profiling,
  Nuclear Instruments and Methods in Physics Research B, Vol.269, (2011), No.3, pp.369-373, ISSN 0168-583X
  journal article - other
• UHLÍŘ, V.; PIZZINI, S.; ROUGEMAILLE, N.; CROS, V.; JIMÉNEZ, E.; RANNO, L.; FRUCHART, O.; URBÁNEK, M.; GAUDIN, G.; CAMARERO, J.; TIEG, C.; SIROTTI, F.; WAGNER, E.; VOGEL, J.:
  Direct observation of Oersted-field-induced magnetization dynamics in magnetic nanostripes,
  PHYSICAL REVIEW B, Vol.83, (2011), No.2, pp.020406-1-020406-4, ISSN 1098-0121
  journal article - other
• KOH, A.; TOMANEC, O.; URBÁNEK, M.; ŠIKOLA, T.; MAIER, S.; MCCOMB, D.:
  HRTEM and EELS of nanoantenna structures fabricated using focused ion beam techniques,
  Journal of Physics: Conference Series, Vol.241, (2010), No.1, pp.012041-1-012041-4, ISSN 1742-6588
  journal article - other
• POLČÁK, J.; ČECHAL, J.; BÁBOR, P.; URBÁNEK, M.; PRŮŠA, S.; ŠIKOLA, T.:
  Angle-resolved XPS depth profiling of modeled structures: testing and improvement of the method,
  Surface and Interface Analysis, Vol.42, (2010), No.5-6, pp.649-652, ISSN 0142-2421
  journal article - other
• URBÁNEK, M.; UHLÍŘ, V.; BÁBOR, P.; KOLÍBALOVÁ, E.; HRNČÍŘ, T.; SPOUSTA, J.; ŠIKOLA, T.:
  Focused ion beam fabrication of spintronic nanostructures: an optimization of the milling process,
  NANOTECHNOLOGY, Vol.21, (2010), No.14, pp.145304-1-145304-7, ISSN 0957-4484
  journal article - other
• ANTOŠ, R.; URBÁNEK, M.; OTANI, Y.:
  Controlling spin vortex states in magnetic nanodisks by magnetic field pulses,
  Journal of Physics: Conference Series, Vol.200, (2010), No.1, pp.042002-1-042002-4, ISSN 1742-6588
  journal article - other
• ČECHAL, J.; LUKSCH, J.; KOŇÁKOVÁ, K.; URBÁNEK, M.; KOLÍBALOVÁ, E.; ŠIKOLA, T.:
  Morphology of cobalt layers on native SiO2 surfaces at elevated temperatures: formation of Co islands,
  Surface Science, Vol.602, (2008), No.15, pp.2693-2698, ISSN 0039-6028
  journal article - other
• URBÁNEK, M.; SPOUSTA, J.; BĚHOUNEK, T.; ŠIKOLA, T.:
  Imaging reflectometery in situ,
  Applied Optics, Vol.46, (2007), No.25, pp.6309-6313, ISSN 0003-6935
  journal article - other
• ČECHAL, J.; TICHOPÁDEK, P.; NEBOJSA, A.; BONAVENTUROVÁ, O.; URBÁNEK, M.; SPOUSTA, J.; NAVRÁTIL, K.; ŠIKOLA, T.:
  In situ analysis of PMPSi by spectroscopic ellipsometry and XPS,
  Surface and Interface Analysis, Vol.38, (2004), No.8, pp.1218-1221, ISSN 0142-2421
  journal article - other
• BRANDEJSOVÁ, E.; ČECHAL, J.; BONAVENTUROVÁ, O.; NEBOJSA, A.; TICHOPÁDEK, P.; URBÁNEK, M.; NAVRÁTIL, K.; ŠIKOLA, T.; HUMLÍČEK, J.:
  In situ analysis of PMPSi thin films by spectroscopic ellipsometry,
  Jemná mechanika a optika, Vol.9, (2004), No.9, pp.260-262, ISSN 0447-6441
  journal article - other
• URBÁNEK, M.; SPOUSTA, J.; NAVRÁTIL, K.; SZOTKOWSKI, R.; CHMELÍK, R.; BUČEK, M.; ŠIKOLA, T.:
  Instrument for thin film diagnostics by UV spectroscopic reflectometry,
  Surface and Interface Analysis, Vol.36, (2004), No.8, pp.1102-1105, ISSN 0142-2421
  journal article - other
• SPOUSTA, J., ŠIKOLA, T., ZLÁMAL, J., URBÁNEK, M., NAVRÁTIL, K., JIRUŠE, J., CHMELÍK, R., NEBOJSA, A.:
  In situ measurements of surface homogeneity of optical parameters of weakly absorbing thin films,
  Surface and Interface Analysis, Vol.34, (2002), No.1, pp.664-667, ISSN 0142-2421
  journal article - other
• URBÁNEK, M., ŠIKOLA, T., NEBOJSA, A., SPOUSTA, J., DITTRICHOVÁ, L., CHMELÍK, R., ZLÁMAL, J., JIRUŠE, J.:
  Monitoring of surface homogeneity of optical parameters of thin films.,
  Micromat 2000, pp.604-609, (2000), Editors: B. Michel, T. Winkler, M. Werner,H. Fecht
  conference paper
  akce: Micro Materials (MicroMat 2000), Berlin, 17.04.2000-19.04.2000

List of publications at Portal BUT